Technical Information

Analysis and Testing Devices

Analysis and Testing Equipment

Neturen Co., Ltd. uses a diversity of hi-tech analysis and testing devices to perform a wide variety of processes ranging from material analysis to lifetime evaluation to promote R&D and streamline its on-site support system.

Transmission Electron Microscope (TEM) CNC 3-dimensional Measuring Instrument
Transmission Electron Microscope (TEM) CNC 3-dimensional Measuring Instrument
Field Emission Scanning Electron Microscope (FE-SEM) X-ray Stress Analyzer (LXRD)
ield Emission Scanning Electron Microscope (FE-SEM) X-ray Stress Analyzer (LXRD)
Electron Probe Micro-analyzer ICP Optical Emission Spectrometer
Electron Probe Micro-analyzer ICP Optical Emission Spectrometer

Other main Analysis and Testing Devices

  • Transformation Point Measuring Device
  • X-ray Diffractometer
  • Fatigue Testers
  • Abrasion Testers