•ͺΝEŽŽŒ±‘•’u‹@ŠBŽŽŒ±“™

Ÿ‘½Žν‘½—l‚Θ•ͺΝEŽŽŒ±‘•’u
Extensive laboratory equipment

“§‰ίŒ^“dŽqŒ°”χ‹Ύ(TEM)
Analytical electron microscope
“dŠE•ϊoŒ`‘–Έ“dŽqŒ°”χ‹Ύ(FE-SEM)
Field emission-Scanning electron microscope
‚wό‰ž—Ν‘ͺ’θ‘•’u(LXRD)
Non-destructive Residual stress measurment system

“dŽqόƒ}ƒCƒNƒƒAƒiƒ‰ƒCƒU[
Electron probe micro analyzer

ICP”­Œυ•ͺŒυ•ͺΝ‘•’u
Inductive coupled plasma spectrometer

CNCŽOŽŸŒ³‘ͺ’θ‹@
CNC-Coordinate machine
Ÿ‚»‚Μ‘Ό‚ΜŽε‚Θ•ͺΝE‰πΝ‘•’u
œ•Ο‘Τ“_‘ͺ’θ‘•’u
œXό‰ρά‘•’u
œŠeŽν”ζ˜JŽŽŒ±‹@
œŠeŽν–€–ΥŽŽŒ±‹@

ŸOther equipments
œTransformation point measuring apparatus
œX-ray auto-diffractometer
œVarious fatigue testing machines
œVarious wear testing machines

‚ΰ‚Η‚ι

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FTC(Fine Techno Center)
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